Maximize your testing throughput with our professional technical documentation for the Probe Fixture Switching mechanism. In high-volume electronics manufacturing, the ability to rapidly engage and disengage hundreds of test points—often called a “Bed of Nails”—is critical for In-Circuit Testing (ICT). This drawing package details a high-precision switching interface designed to actuate a probe plate against a Device Under Test (DUT). By utilizing specialized “Pogo Pins” and a synchronized mechanical or pneumatic press-down frame, this mechanism ensures that every probe makes consistent, low-resistance contact with its designated test pad.

The provided drawing package offers an exhaustive look at the alignment pin geometry and the parallel-plate actuation required to prevent PCB flexing or probe damage. By analyzing the electrical isolation layers and the modular “interchangeable cassette” design in these blueprints, engineers can build a base unit that supports multiple different product types with minimal changeover time. We offer these high-fidelity CAD resources for free to help test engineers design robust fixtures that maintain signal integrity even at high frequencies.

Our files are formatted for seamless integration into 3D engineering software, allowing you to perform “force-balance analysis” to ensure the spring pressure from hundreds of probes doesn’t warp the fixture frame. This ensures that the switching mechanism remains reliable over hundreds of thousands of cycles. Download this essential resource today to streamline your functional testing and improve your quality control metrics.

Key Features:

  • Precision Vertical Actuation: Engineered with linear bearings to ensure the probe plate moves perfectly perpendicular to the DUT, preventing lateral probe stress.
  • ESD-Safe Material Specs: Detailed requirements for anti-static G10/FR4 plates and ESD-compliant coatings to protect sensitive electronics.
  • Modular Interface (Receiver/Cradle): Features a “mass-interconnect” design that allows the test head to be swapped out in seconds without re-wiring.
  • Balanced Spring-Load Support: Optimized structural ribs designed to counteract the cumulative upward force of high-count pogo pin arrays.
  • Integrated Vacuum/Pneumatic Logic: Includes schematics for internal air routing if the fixture utilizes vacuum-suction for board pulldown.